Speaker
Description
Low intensity ion beams (below 10 million ions/sec.) can be provided at HIT for various experiments via manual degrading, but for now without a feedback system. The development of a transverse ion beam profile monitor for low intensity regions is therefore of interest. The principle of operation is based on scintillating fibres, which transform deposited energy of a throughpassing ion in photons, which are then converted and amplified via silicon photomultipliers (SiPMs) to electric pulses. These pulses are recorded and processed by a new sophisticated readout electronics, the front-end readout system (FERS) A5200 by CAEN. A prototype set-up consisting of all above mentioned parts was tested in beam and has proven to record the transverse beam profile successfully from the intensities of 1E7 ions/s till as low as 100 ions/s.
